@article{DAN Wen-Fa:85,
author = {[DAN Wen-Fa, HU Xin-Yi, SA Xue-Yuan, YU Chu-Xian, ZHANG Li-Hua, ZHENG Jiang-Yun]},
title = {<span>Predicting stability of integrated circuit test equipment using&nbsp;</span><span>upper side boundary values of normal distribution</span>},
publisher = {The Journal of China Universities of Posts and Telecommunications},
year = {2024},
journal = {Journal of China Universities of Posts and Telecommunications},
volume = {31},
number = {2},
eid = {85},
pages = {85-93},
keywords = {<p class="2" style="margin-left:0cm;">
	K-means clustering algorithm, <span>the upper side boundary</span> of normal distribution,
threshold, IC test equipment stability analysis
</p>},
doi = https://jcupt.bupt.edu.cn/EN/10.19682/j.cnki.1005-8885.2024.0002
}