TY  - The Journal of China Universities of Posts and Telecommunications
A1  - 
T1  - <span>Predicting stability of integrated circuit test equipment using&nbsp;</span><span>upper side boundary values of normal distribution</span>
Y1  - 2024-04-30 00:00:00.0
JF  - Journal of China Universities of Posts and Telecommunications
JO  - The Journal of China Universities of Posts and Telecommunications
SP  - 85
EP  - 93
VL  - 31
IS  - 2
UR  - {https://jcupt.bupt.edu.cn/EN/10.19682/j.cnki.1005-8885.2024.0002}
N1  - 10.19682/j.cnki.1005-8885.2024.0002
ER  -